Used TOPCON WM 3000 #9106563 for sale

TOPCON WM 3000 is a fully automated mask and wafer inspection equipment designed for efficient screening and evaluation of defects in semiconductor fabrication. The system features an advanced, powerful hardware platform that is optimized for high-speed, high-resolution defect inspection. It also includes a color-coded display that easily program paths, parameters, and limits to accurately measure difficult-to-detect microscopy defects. WM 3000 allows for individual features, surfaces, and materials to be tested and compared for their defectiveness. TOPCON WM 3000 is equipped with two independent top-down cameras, one of which is color-controlled and Infra-Red (IR) filtered for imaging in the visible range. It is designed with a range of beamlets, lenses, filters, and aperture settings to inspect varying sizes, shapes, and features of objects. Both cameras are synchronized with Illuminator X-Y-Z scan systems for accurate positioning and a repeatable focused beam for high resolution imaging. The user-friendly software workspace has multiple parameter settings, including an advanced image recognition unit that incorporates auto-callouts and mathematical morphology functions to ensure accurate defect recognition. The automated mask and wafer inspection machine is integrated with a pattern recognition process allowing for defined defect characterization. The user can also select different models for the morphological based algorithm for an improved detection of false alarms and for increased accuracy when results are needed quick. Other features of the tool include an edge based signal-to-noise ratio (SNR) calculations for identifying small defects in low contrast images, and a motion-detection module that is capable of recognizing defects in challenging, dynamic images. WM 3000 is also compatible with a number of industry-standard software packages, allowing for an efficient integration into an existing defect review process, or to use advanced automation techniques. The asset is also equipped with an auto-correction option for mask and wafer fabrication processes. It's distributed to meet your specific needs and the digital output interface allows for easy connecting to databases and other software tools. This efficient inspection model is extremely user-friendly and organized, designed to maximize productivity in the production of microelectronics.