Used TORAY Inspectra 1000EX-ll 300 #9157736 for sale

TORAY Inspectra 1000EX-ll 300 is an advanced mask and wafer inspection equipment designed for extensive inspection of wide range of devices. This system is equipped with patented SOI technology imaging to ensure accurate and reliable results. It utilizes a 300mm/12 inches wafer inspection capability and a full suite of image analysis tools to quickly detect defects. It also features a high-end 5 megapixel color 3D sensor capable of achieving x-y-z resolution of 0.1 micrometers. The unit utilizes an unrivaled optical imaging machine to capture up to 100µm of detail. The dynamic stage range of 2mm to 16mm allows for high-precision imaging of multilayer wafers, enabling better accuracy and greater details. TORAY INSPECTRA-1000EX-LL 300 is able to detect a variety of defects that occur in the manufacturing processes of mask and wafers such as particle defects, metrology defects, irregular distribution of scum, immersion defects, and many more. These defects can be identified with imaging analysis capabilities such as SEM/FIB cross-sectional imaging and targeted review. Inspectra 1000EX-ll 300 also uses laser-based wafer distortion measurement systems for enhanced wafer integrity validation. This tool is capable of measuring surface-level distortions using sophisticated 3D particle imaging techniques. This helps provide insight into areas of concern and to identify opportunities for improvement. The asset includes an integrated defect management model, which enables efficient product defect review across all process steps. This equipment is able to track defects across multiple paths and is also able to integrate with external databases. INSPECTRA-1000EX-LL 300 also comes with an industry-standard Windows-based graphical user interface. Multiple users can access the system at once, making collaboration easier than ever before. In conclusion, TORAY Inspectra 1000EX-ll 300 is a powerful and reliable mask and wafer inspection unit that is trusted by major industry-leading manufacturers. It provides high-resolution imaging capabilities, efficient defect management, and laser-based distortion measurement systems. Combined with its robust graphical user interface, this machine is an ideal solution to any mask and wafer inspection task.