Used TORAY Inspectra PL #9248866 for sale

TORAY Inspectra PL
ID: 9248866
Wafer Size: 6"
Defect inspection system, 6" GaN SiC.
TORAY Inspectra PL is a powerful and highly accurate Mask & Wafer Inspection equipment. It is specifically designed to detect various types of defects on semi-conductor wafers and masks. The system utilizes advanced vision and image processing algorithms to identify and inspect a wide variety of potential defects. The unit follows a precise pattern recognition technique to inspect each wafer and mask using synchronized exposure and imaging times. This eliminates the need for manual visual inspections which can be cumbersome and time consuming. In addition, the machine employs advanced algorithms for auto-calibration and 3D estimation which drastically reduces diagnosis and compatibility issues between the mask and wafer. The tool is able to detect various types of defects such as scratches, mounds, broken lines, and pattern slippage. It is also capable of identifying potential sub-surface and top-surface artifacts with a single scan. Moreover, the asset can also detect subtle distortions, dopy patterns, missing features, and other abnormalities on top of the wafer surface. The model comes with a range of features that simplify the mask and wafer inspection process. It has an intuitive user interface which makes operating the equipment quick and easy. Further, it comes with a highly responsive optical system that helps in developing a precise image without compromising speed and resolution. It also offers a range of reports and analysis functions which help users to better analyze results and pinpoint certain defects. Inspectra PL is an ideal solution for ensuring consistent and reliable quality control throughout the manufacturing cycle. As a result, it is used by many leading semiconductor companies in many different industries.
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