Used TORAY Inspectra #9137298 for sale

TORAY Inspectra is an advanced automated mask and wafer inspection equipment that provides a fast and comprehensive surface defect analysis. It is an effective tool for a variety of applications, including semiconductor device manufacturing, MEMS, and wafer metrology. The system utilizes high-speed focus and highlight imaging to capture images of the substrate and identify defects. It features an automatic image acquisition unit, which allows for faster and more efficient processes. The machine can also measure various critical wafer parameters, such as profile, thickness, and uniformity. The main components of the tool are a focus controller, a light source, a processor, and an image sensor. The focus controller controls the position of the light source and the image sensor. This allows for a highly detailed analysis of the substrate's surface. The light source is used to display the image on the monitor, and the processor is used to compare the image to a predetermined defect-size and shape. The asset is designed to identify both large and small defects. The image sensor can capture images of different size, shape, and intensity levels, allowing for more accurate detection. The threshold for detecting defect can be adjusted to match the target defect size. In addition, the model offers a range of options for defect detection and analysis. It can detect defects in both the vertical and horizontal direction, as well as combine them for accurate determination. It also provides two types of analysis for each direction-manual and automated. This allows for greater flexibility in how the user wants to analyze the data. In conclusion, Inspectra is an effective and advanced tool for mask and wafer inspection that provides fast and comprehensive surface defect analysis. Its features include: a high-speed focus and highlight imaging equipment, a processor for analyzing the image, and adjustable thresholds for defect size. It's a great system for fabricators, enabling them to quickly identify and analyze large and small defects.