Used TOSHIBA / NUFLARE NPI-5000-257 #9245472 for sale

TOSHIBA / NUFLARE NPI-5000-257 Mask & Wafer Inspection Equipment is an innovative and powerful machine built for high-precision inspection of mask and wafer substrates. It is designed to detect a wide range of defects, on a variety of substrates, in both die and circuit patterns. TOSHIBA NPI-5000-257 system is composed of three main components: an advanced imaging module, a high-end software suite, and an advanced optical microscope. The imaging module has a scan rate up to 8.5 frames/second enabling fast and accurate imaging of substrates. It also contains a 5-axis motorized stage to allow for precise positioning of the substrate during scanning. The software suite includes advanced algorithms that enable the unit to detect various types of defects, such as cracks, microshrinkage, voids, particulate contamination, normal variations, etc. These algorithms are also used to analyze and compare the various features of each substrate to identify defects before they are visible to the naked eye. To facilitate the interpretation of the results, the software suite has an intuitive user interface enabling easy navigation and control of the machine. The microscope is responsible for providing image amplification and contrast necessary for the tool to detect and identify defects. It is designed to maximize image clarity using sophisticated optics and image processing techniques. The microscope also offers a wide field of view for large-sized substrates and precision-level resolution for critical defects. NUFLARE NPI-5000-257 Mask & Wafer Inspection Asset is fast and accurate, providing outstanding quality assurance for mask and wafer substrates. Its advanced software and imaging modules ensure comprehensive and reliable defect inspection, while its powerful microscope drastically increases accuracy. The model is thus invaluable for a wide range of inspection applications, and is highly recommended for quality assurance purposes.