Used UENO SEIKI RT20T #293637995 for sale

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ID: 293637995
Vintage: 2014
Visual inspection system 2014 vintage.
UENO SEIKI RT20T is a mask and wafer inspection equipment designed for a wide range of semiconductor and optoelectronics applications. It utilizes a Laser Interferometer to precisely measure the profile of mask and wafer edges to meet the extremely stringent industry requirements. RT20T is capable of measuring mask and wafer thickness and other parameters such as width and height with an accuracy of mean +3 micron and a minimum of 5 micron across the full wafer surface. The system is specifically designed to detect scattering, abrasion, erosion, and other surface defects on the mask or wafer and measure the corresponding parameters. The strong 2048 channel laser interferometer is integrated into UENO SEIKI RT20T, providing a robust profile measurement capability. The reliable and advanced background subtraction and peak search technologies reduce the effects of low-level optical noise. The unit features a built-in wafer inspection software, which allows operators to detect surface defects and print reports, with optional analysis and information storage capabilities. The advanced image processing algorithms allow for improved speed and accuracy when analyzing data. RT20T also offers excellent capability for wafer inspection. It can measure the wafer profile and line width, thickness, and other parameters. The machine is equipped with a high-powered laser and a vibration compensation mechanism, enabling high speed and accurate measurements and improved defect recognition. UENO SEIKI RT20T is a cost-effective and high-performance mask and wafer inspection machine, designed to meet the stringent industry standards. It provides reliable, high-speed and accurate inspection for a broad range of semiconductor and optoelectronic devices. The combination of advanced image processing algorithms, high-speed laser interferometer, and wafer inspection software makes RT20T an ideal solution for mask and wafer inspection.
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