Used ULTRAPOINTE 1000 #9026314 for sale
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ULTRAPOINTE 1000 is a mask and wafer inspection equipment designed for high-resolution imaging and analysis of photomask, semiconductor photomasks, and semiconductor wafers. The system is capable of wafer inspection at up to 3.3µm resolution, with excellent accuracy and repeatability. 1000 leverages revolutionary mask and wafer inspection technology to provide unparalleled performance in scanning photomasks and wafers with high accuracy and repeatability. The unit consists of a wafer stepper, one or more high resolution cameras, a lens/optics interface, and a computer-based image analysis and acquisition machine. The wafer stepper provides a robotic mechanism with the ability to accurately align, optical components, and cameras. High resolution CCD cameras, mounted on the stepper, acquire images of the top and bottom of the wafer for analysis. The wafer stepper is stabilized by a pair of anti-vibration air isolators, to ensure that the capture process is stable on the wafer's flat surface. ULTRAPOINTE 1000 features highly efficient optics, provided by precision-crafted components that deliver resolution up to 3.3μm. A wide angle optical tool is utilized to maximize the field of view, enabling multiple mask/wafer inspection points to be simultaneously analyzed. The lens/optics interface is mounted directly on the wafer stepper, allowing the optimal scan field to be set precisely. The computer-based image analysis and acquisition asset provides powerful software tools that allow images to be analyzed quickly and accurately. Advanced 3D algorithms allow for defect recognition and inspection of wafers for common defects such as scratches, dust, particles, and other contaminants. 1000 mask and wafer inspection model provides the accuracy, repeatability and high resolution required by modern semiconductor fabrication process. Its advanced optics and image analysis equipment provides unparalleled performance in photomask and wafer inspection. By utilizing the system, manufacturers of semiconductors are able to detect problems quickly, leading to faster production, lower cost goods, and ultimately, improved delivery of high quality semiconductor products to the market.
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