Used ULVAC SP1 #9296177 for sale

ULVAC SP1 is a sophisticated mask and wafer inspection equipment designed to provide manufacturers with extremely accurate and in-depth information for total quality control. It is capable of identifying imperfections in ultra-low voltage semiconductor wafers, nano devices, 3D substrates, and more. ULVAC SP-1 is equipped with a high-accuracy optical imaging system for close-up views of the wafer's surface and edges. This unit is capable of detecting a wide range of defects such as particles, chips, scratches, and bumps. With a maximum resolution of 20nm, every detail is captured. Additionally, the machine is capable of recognizing minute curves, slopes, and grooves of the surface. To ensure the accuracy of the data, SP1 features a high-speed image processing tool. This asset uses algorithms to recognize various pieces of data and individualss can customize the processing parameters. Additionally, the model can detect the exact coordinates of defects on the wafer. SP-1 also includes an integrated tilt control equipment that allows users to rotate samples up to 180 degrees for precise measurements. This feature allows for a deeper understanding of the wafer's structure. Additionally, the system is equipped with a laser auto-focusing unit that detects minute changes in focus and corrects them. Finally, ULVAC SP1 includes a film measurement machine. This allows inspectors to evaluate each film's thickness and shape, as well as any contaminants or scratches. It can also detect differences in film thickness, allowing for more precise measurements. The comprehensive features of ULVAC SP-1 make it an ideal tool for mask and wafer inspection. Its high accuracy and detail allow for an effective and efficient quality control process. With the help of SP1, manufacturers can achieve wafer and mask excellence with confidence.