Used VIKING / DYMATIX J-1 #9117519 for sale

VIKING / DYMATIX J-1 is a mask and wafer inspection equipment for the semiconductor manufacturing industry. It offers a comprehensive package of capabilities, including high-precision optical inspection, defect review, critical area analysis, die rotation, and metrology analysis. This system offers a wide range of inspecting capabilities for a variety of wafer types, including bulk CMOS, MEMS, and image sensor devices. It has an optical structure which consists of two microscopes, allowing for multiple imaging options. The first microscope is a color TV microscope for viewing whole wafer or die-level images, as well as per-die defect statuses. The second microscope provides capabilities for identifying CD or line widths, as well as for surface inspection. Its unique configuration enables users to switch between stereo (2D) and digital (3D) capabilities. VIKING J-1 also provides automated alignment and wafer resistance measurement, helping to avoid unnecessary manual operations. In addition, its advanced image-processing capabilities allow for the automatic detection, inspection, and analysis of patterned and non-patterned areas. It also has the ability to cross-correlate die map features for defect tracking and analysis, as well as the capability to screen for process-induced defects and impairments. To ensure the highest precision, the unit uses a proprietary optical pixel array for improved imaging performance and reduced occlusion. DYMATIX J-1 machine can be upgraded in line with a user's requirements. It boasts advanced pattern recognition algorithms, which can be configured to increase the level of accuracy for any job. It also features a comprehensive defect analysis package, including parametric color mapping and pattern recognition. The tool can be equipped with an in-line pattern optimization option, enabling visual inspection of alignment and focus without the need for additional optical alignment tools. In addition, J-1 asset is designed to meet the increasingly stringent quality standards of the industry. It offers a wide range of test coverage, including photomasks, LCD/LCOS, scribe lines, through-holes, 4-sided alignments, and defect detection. It has a high throughput rate and is capable of high-resolution imaging, ensuring shorter cycle times for a full wafer/die analysis. In summary, VIKING / DYMATIX J-1 is a powerful, high-precision wafer and mask inspection model, providing automated and manual capabilities for defect analysis and metrology. It features comprehensive optical and image-processing capabilities, as well as pattern recognition algorithms and in-line pattern optimization options. It is designed to provide industry-leading quality assurance and reliable results.