Used VITRONICS SOLTEC 104873 #9175105 for sale

VITRONICS SOLTEC 104873 is a mask and wafer inspection equipment that utilizes a UV-A LED (Light Emitting Diode) light source and a proprietary line and edge scan methodology to detect defects on an IC (Integrated Circuit) wafer. The system uses a multi-angle, diffused, UV-A LED illumination that is adjustable from 85 microns to 1600 microns to inspect IC wafers up to 150mm (6 inches) in diameter. The unit includes a non-contact laser interferometry unit which enables the device to measure critical dimensions, by projecting a laser line onto the IC and collecting deflection data. This enables 104873 to detect defects both on and underneath the printed surface of the IC wafer. The machine is designed to inspect multiple mask levels and features, including optical alignment features for IC wafers up to 150mm in diameter. It is equipped with Precise Motion & stage Tool technology, which combines pre-calibrated feedback control with linear motors and servo control technology to ensure decreased control response ranges, improved accuracy, and better repeatability. VITRONICS SOLTEC 104873 is a reliable asset with high speed and quality performance, with the capability to inspect ICs at speeds of up to 2,500 wafers per hour. The model also includes a powerful and user-friendly EH2 Graphical User Interface, which enables users to easily set up the equipment to perform comprehensive tests and achieve maximized operating labor. Furthermore, the system comes with an enhanced MicroVision Wafer Alignment (WA) feature which can be used to detect, measure and analyze small IC features. The unit is designed with advanced algorithms and optical inspection tools to ensure accuracy and precision. The advanced tools used by 104873 includes SEM (Scanning electron microscopy) that can detect line widths and patterns on the ICs with greater precision than visual inspection. Additionally, it uses parameters based on Scanning Optical Microscopy (SOM), which allows the machine to inspect larger areas with higher resolution. VITRONICS SOLTEC 104873 is also capable of background inspection, which involves scanning the IC wafer using a pattern recognition algorithm that identifies and measures molecules such as dust, contaminants and contaminants from prior IC processes. It can also measure line/space and image recognition features, making it suitable for applications such as semiconductor circuit fabrication or inspection. Additionally, the tool is designed with on-board particulate detection that can detect particles smaller than 0.5 microns. 104873 is an ideal asset for inspecting IC wafers, as it utilizes advanced optical tools to provide accuracy and precision. Furthermore, the model includes a non-contact laser interferometry unit and enhanced MicroVision Wafer Aligner (WA) features that provide accurate, repeatable and comprehensive measurements. Additionally, VITRONICS SOLTEC 104873 is suitable for background inspection and small molecule detection, making it an ideal equipment for inspecting IC wafers.