Used WACCO Auto visual inspection system #293661625 for sale

WACCO Auto visual inspection equipment is a state-of-the-art mask and wafer inspection system developed for use in semiconductor fabrication. It is capable of inspecting a range of sample materials, ranging from a variety of metals to glass, ceramic, quartz, and even photosensitive materials such as Polyimide, ITO, and other light-sensitive surfaces. The unit utilizes unique light field imaging and focus control technologies to optimize the appearance of defects, while ensuring maximum efficiency in the inspection process. The machine is equipped with multiple imaging modules that enable the simultaneous detection of both surface and sub-surface defects. The surface defects are detected by a CCD camera equipped with a macro lens, while the sub-surface defects are detected using a digital photomicrograph camera. Both of these cameras have an optical zoom feature, allowing the user to adjust the magnification according to the material type and required resolution. To assist with identification, the tool can create images of up to 1000 x 1600 pixel resolution. Furthermore, the user can also adjust the depth of field to gain a better understanding of the defects. To ensure the accuracy of the inspection, Auto visual inspection asset uses a powerful embedded computer aided inspection (CAI) software. This software is designed to analyze the images taken by the imaging modules and then compare them to a pre-defined database of accept/reject criteria. The software then displays the results in an easily understandable format. The comprehensive CAI capabilities of the model allow it to quickly and accurately identify even the smallest of defects in a device or sample. In addition to the visual inspection process, WACCO Auto visual inspection equipment also includes several other useful features. The system is integrated with a powerful thermography module, allowing the user to detect thermal differences in the sample that could indicate the presence of defects. It also comes with an additional imaging module that is designed to detect particles or organic contaminants on and around the sample. Overall, Auto visual inspection unit is a powerful and reliable tool for inspecting the exacting standards of semiconductor materials. It is equipped with multiple imaging modules, a powerful CAI software package, and an integrated thermography module. All of these features enable the machine to quickly identify and analyze even the most minor of defects in a device or sample. With its comprehensive capabilities, WACCO Auto visual inspection tool is an invaluable asset for semiconductor fabrication facilities.