Used WCT MPM-6000V-U #9267092 for sale

WCT MPM-6000V-U is a professional grade mask and wafer inspection equipment designed for monitoring the integrity of semiconductor fabrication process. This system provides superior imaging capabilities and features that enable production engineers to screen and assess both mask and wafer imperfections during manufacturing. MPM-6000V-U provides high-precision imaging capabilities for both masks and wafers up to 8 inches in diameter. Its dual side computing power is able to handle double side inspection at the same time. The unit utilizes advanced optical and imaging technology, with simultaneous multi-edge matching techniques to perform automatic defect detection and classification. The machine also offers reliable, high quality imaging performance for both surface and internal defects for a wide range of semiconductor fabrication processes. The tool's user interface is customizable and easy to use with detailed audit trail options. Different programs such as basic inspection, statistical process control and asset status can be quickly customized and adjusted. The comprehensive reports generated by the model are customizable and can be sent via email or fax. WCT MPM-6000V-U comes with a range of advanced features designed to maximize monitoring and reporting capabilities. The real-time image capture feature enables engineers to view images of defects that are present in real-time and plan response actions in advance. The equipment also provides quick defect marking and sorting, allowing engineers to precisely identify and assess defects. From a safety and convenience point of view, the system is designed to be easy to maintain and operate. It includes a safety key unit that monitors and changes settings in order to keep unauthorized personnel from tampering with the machine. The tool also includes a calibration module that allows for regular calibration to ensure accuracy and consistent performance. MPM-6000V-U is a powerful mask and wafer inspection asset designed to accurately detect and assess defects present in semiconductor manufacturing processes. It features advanced optical and imaging capabilities, user-friendly interfaces, and precise defect detection and classification. With its range of advanced features and user-friendly operation, it is an excellent choice for businesses looking for a reliable solution to monitor and analyze semiconductor manufacturing processes.