Used WELCH Allyn 76791 #9003994 for sale

WELCH Allyn 76791 Mask & Wafer Inspection equipment is a highly versatile inspection system designed for the examination of both wafer-level and mask-level devices. Its application ranges from the evaluation of small wafers to the inspection of large masks. The unit offers a range of image magnification, illumination, and resolution capabilities that enable accurate visual inspection of even highly complicated devices. Allyn 76791 Mask & Wafer Inspection Machine comes with an integrated 5 megapixel dimpleless color camera able to capture images with a resolution of up to 2560 x 1920 pixels, thus providing a generous 22 to 46x optical magnification depending on the lens used. The camera is connected to the tool's light guide, which in turn provides four color LED illumination ranging from ultraviolet to infrared and a bright 100W Xenon arc lamp used for brightfield illumination. The camera can also capture sequences of images that can be mated to 3D scanning applications. Alignment features ensure accurate and precise positioning as well as allowing magnification up to 1000X when combined with WELCH Allyn's proprietary scanning objective lenses. The powerful software environment included with the asset provides tools for finding anomalies, enabling visualization of layers and providing applications for defectivity analysis applications. WELCH Allyn 76791 Mask & Wafer Inspection Model comes with two separate workstations, one for the maintenance and operation of the equipment and another one for the analysis of images captured. The first workstation provides the necessary environment for setting up of the system, as well as adjusting parameters related to magnification, resolution, brightness, and contrast. The analysis workstation enables viewing, measurement and annotation of images acquired by the unit. Allyn 76791 Mask & Wafer Inspection Machine offers several operational modes, among them a fully automatic mode that makes it capable of finding small irregularities and defects such as spot, lines, line end violations, or short and open circuits. Additionally, there are also several manual modes that give the user the capability to explore and inspect the device under examination. WELCH Allyn 76791 Mask & Wafer Inspection Tool is easy to use, reliable, and provides accurate results when compared to other inspection systems available in the market. It is a cost-effective asset that can provide detailed analysis of small and complicated systems, ideal for semiconductor device manufacturers or research and development applications.