Used WESTOVER FV-400 #9206715 for sale
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WESTOVER FV-400 Mask & Wafer Inspection equipment is a reliable laser vision solution for overall defect and particles detection on photomasks and wafers used in the semiconductor industry. This system incorporates special high-speed image capture, advanced video processing, and highly robust automatic defect detection capabilities. It is designed to meet the stringent requirements of today's mask and wafer inspection applications. FV-400 is equipped with CMOS cameras with an unprecedented 10,000 frames-per-second rate and a high sensitivity for extraordinary image quality. Its laser optics enable precise defect detection with high resolution. In addition, it features top-level defect pattern recognition capabilities for accurate defect classification and reporting, allowing users to quickly and accurately identify potential production issues. The unit facilitates rapid setup from easy-to-use menu-driven operation, allowing users to run automated alignment and mask/wafer verification tasks without restrictions. The ergonomic design of the machine's rapid-change auto-focus module further enables quick and precise auto-focus inspections for masks and wafers of all thicknesses and sizes. The user-friendly software interface of WESTOVER FV-400's PC-based control tool provides a highly intuitive environment for users to configure their asset parameters in order to customize the model to fit their inspection needs. The equipment also offers built-in intelligence functions to identify common problems and automatically adjust inspection settings, as well as powerful patterns matching algorithms to drive defect detection. FV-400 Mask & Wafer Inspection system is an ideal solution for efficient mask and wafer inspection without compromising on accuracy or throughput. It is highly suitable for both high-end and low-volume production operations, thanks to its robust modular construction. With its state-of-the-art hardware and advanced software features, WESTOVER FV-400 Mask & Wafer Inspection unit offers unparalleled performance in defect and particle detection.
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