Used WITHLIGHT OPI-110 #9248775 for sale

WITHLIGHT OPI-110 is a powerful mask and wafer inspection equipment that can be used for both research-grade and production-grade applications. Featuring a cutting-edge design, OPI-110 can detect even the slightest defects in a range of materials, from semiconductor and circuit wafers to thin-film masking materials. The system is designed to maximize efficiency and minimize operator errors. WITHLIGHT OPI-110 features an advanced imaging unit that utilizes infrared and visible light to detect defects and surface imperfections. This machine provides high-sensitivity and fast inspection speeds, allowing for higher throughput in a single operation. It also includes a laser-assisted alignment tool that helps ensure accurate placement of inspected objects. Its modular design allows for quick installation and replacement of parts, and easy integration with other inspection and imaging systems. The asset is powered by a reliable 32-bit ARM processor, which ensures speedy data transfers and allows for exceptional accuracy and precision. With its full-color high-resolution display, OPI-110 allows users to easily view and analyze inspection results. In addition, the model utilizes a variety of software tools and algorithms to adequately manage data and generate reports. WITHLIGHT OPI-110 is equipped with a variety of safety features to ensure safe operation. It is designed to protect both the operator and the inspected objects from damage or contamination. It also features a low vibration design that reduces noise levels and prevents interference with other systems and equipment. It is also equipped with an emergency shutoff equipment and a tamper warning system for added security. OPI-110 is a powerful mask and wafer inspection unit that can reliably detect defects and defects in a range of materials with exceptional accuracy and speed. With its advanced imaging machine, modular design and a range of safety features, this tool can be trusted to provide an effective and efficient inspection process.