Used WITHLIGHT OPI-110 #9281914 for sale

WITHLIGHT OPI-110 Mask & Wafer Inspection Equipment is a complete solution for inspecting a range of semiconductor materials for flaws, defects, and other inconsistencies. This system offers a high-resolution imaging solution with a wide field of view, allowing for accurate and efficient inspection of a range of materials. OPI-110 features a unique imaging microscopy that is capable of both bright field and dark field imaging. This binocular microscope Optical Path Interferometry unit can be easily adjusted to observe features as small as 0.5μm, allowing manufacturers to effectively detect flaws, contamination, and other contaminants in the material. Its precision optics provide the user with a high-resolution image that can be quickly and easily navigated by simply shifting the focus. WITHLIGHT OPI-110 also features an automated wafer handling machine, designed to help streamline and speed up the inspection process. With its lightweight design, the tool can be easily set up and repositioned, enabling smooth, accurate sample loading. The asset is also equipped with advanced software/hardware integration, which enables users to control the model's parameters and visualize the image in high-resolution, near real-time. In addition to optical inspection, OPI-110 can also be used for laser beam induced current (LBIC) imaging. This technique enables users to detect variations in the material's behavior up to 6μm. The LBIC technique is also capable of detecting non-uniform areas in the sample, providing users with detailed, real-time information. WITHLIGHT OPI-110 is an ideal solution for any semiconductor manufacturer seeking a reliable and efficient means of inspecting both wafers and masks. By utilizing its range of sophisticated imaging capabilities and automated sample handling equipment, OPI-110 offers manufacturers the ability to accurately and quickly detect flaws, contamination, and other inconsistencies in the material, thereby improving the quality of their products.