Used YOLI NEW TECHNOLOGY ER-880M #9133860 for sale

YOLI NEW TECHNOLOGY ER-880M is a high-speed, multi-function mask and wafer inspection equipment designed for defect analysis in advanced semiconductor fabrications. The system utilizes leading edge optics, optics, image processing, and electronics to deliver precise testing and unparalleled detail resolution. ER-880M is designed with a mainframe that houses the following components; a laser scanning unit that precisely evaluates the mask or wafer surface, a CCD camera to capture inspection images, an integrated software suite includes feature extraction, defect recognition and classification, and a full complement of search, analysis, and reporting tools; and a digital image processor for post-processing of the images. YOLI NEW TECHNOLOGY ER-880M can be configured to scan and measure in both linear and 2D directions simultaneously. It can also be configured to perform both manual and automated inspection routines, making it ideal for a variety of applications including; failure analysis, mask registration evaluations, IC testing, optical measurements, and leakage testing. The machine provides up to 20X magnification, and a range of detectable defects down to 5 microns. It also incorporates sophisticated 3D analysis to provide detailed information regarding both topographical and electrical properties of the sample surface, enabling rapid readings and drawings across various areas of the sample without significant distortions. The interface is highly intuitive and user-friendly, with intuitive layout, clear instructional labels, and guidance for operations. The software suite that comes with ER-880M makes it easy to configure search protocols, analyze images and perform measurements directly from the tool. Additionally, it can be configured to support both digital and analogue outputs, allowing for convenient storage and transfer of inspection results. In conclusion, YOLI NEW TECHNOLOGY ER-880M is a powerful and versatile mask and wafer inspection asset, perfect for a variety of advanced semiconductor fabrication processes. With its advanced optics, comprehensive array of features, intuitive software interface, and reliable performance, ER-880M is ideal for achieving the highest precision and accuracy for defect analysis.