Used ZYGO 7702 #9196229 for sale

ZYGO 7702 Wafer Inspection Equipment is a device that is used to inspect the integrity of micro devices such as integrated circuits, semiconductors, and other electronic components. This system is a highly advanced and automated tool specifically designed for inspecting wafers and micro devices. 7702 combines a powerful optical microscope with automated imaging and data acquisition components that are designed for wafer and mask inspection. This unit uses advanced laser autofocus technology, which is a highly accurate optical measurement technology able to accurately measure the surface of a device's pad, lead, or contact point. ZYGO 7702 is able to measure and inspect flatness, thickness, pattern integrity, deposition uniformity, as well as signs of contamination, particulate, pitting, or any other defect. 7702 also incorporates a high precision stepper, which provides smooth scanning movement while acquiring topographical images of micro devices and wafers. The stepper is capable of providing highly detailed images that can be used to measure surface characteristics including profile, roughness, defects, adhesion, placement, or any other non-contact measurement of a surface. ZYGO 7702 also includes a unique image analysis component, which simplifies traditional manual wafer inspection by automating the processes associated with image capturing, analysis, and data plotting. 7702's image analysis solution can detect defects not visible in standard microscope images, such as lithography or precision defects. The machine can detect these defects using intelligent algorithms and a powerful image library, while also providing reliable and repeatable results. In addition, ZYGO 7702 features a full suite of real time scanning and acquisition hardware capable of recording up to 8,000 frames per minute. The tool is able to capture, analyze, and process data at speeds up to 32,000 frames per second. Overall, 7702 Wafer & Mask Inspection Asset is a powerful, reliable, and highly accurate tool for inspecting, measuring, and analyzing micro structures and wafers. Its combination of optical microscopy, image analysis, and automated data acquisition capabilities make it an exceptionally valuable model for any inspection laboratory.