Used ZYGO 7714 #293668057 for sale

ZYGO 7714 mask & wafer inspection equipment is a versatile, turnkey solution designed for defect detection and analysis of memory, logic, RF, and CMOS device structures. It combines advanced optics, multispectral white light image contrast techniques, and flexible computing platforms to help identify defects in the most advanced process layers. 7714 system employs powerful optics and multispectral white light imaging contrast techniques to detect advanced defects. It utilizes an advanced image capture unit that is optimized with ZYGO proprietary algorithms for the highest level of defect detection accuracy. The machine can reveal defects as small as 0.2 microns in size, and can identify tramp particles, particles, and line/space breaks that are too small to be seen with a standard microscope. ZYGO 7714 also offers manual inspection capabilities, with probe and imaging arms that can be easily maneuvered to access difficult-to-reach areas. It offers a fully integrated wafer inspection tool and provides automated batch processing. 7714 is equipped with a powerful graphical user interface that is designed to simplify the learning curve for users. Its intuitive design, along with the on-screen assistance, make it easy to teach and use. The asset's wizards and menus provide quick access to detailed setup options and help users select the best settings for their defect inspection needs. In addition to its impressive inspection capabilities, ZYGO 7714 boasts a powerful computing platform and high-bandwidth data/video acquisition architecture. This allows high-speed data analysis, and enables fast defect evaluation and sorting. For customers seeking maximum performance, ZYGO has developed the X-Ray-Archive option, which makes image storage and archival possible. This feature can store detailed images and wafer maps that allow extensive time-lapse capabilities. Above all, 7714 is designed to give customers the fast, comprehensive defect analysis capabilities they need. It offers a reliable and cost-effective inspection model that is suited for both 2-D and 3-D Wafer and Mask Inspection applications.