Used ZYGO AV 6010T #293608585 for sale

ZYGO AV 6010T is an advanced mask and wafer inspection equipment, designed to ensure an optimized production yield. It is ideal for process control, quality control, assessing failure analysis and final yield-related issues. The system utilizes automated, non-destructive wafer testing and mask thickness measurements, utilizing an automated optical microscope (AOM). The unit's imaging machine is comprised of a series of opto-mechanical components, including controller, optical module and test head, with 10x and 20x imaging objectives. These components are designed for rapid wafer imaging, allowing for dynamic defect detection and verification. ZYGO 6010T also uses an automated object tracking tool, which allows for detection, classification and reporting of particle defects. The asset is equipped with a comprehensive set of software tools, including an industry-standard data analysis package and an image processing library. With this feature, users can customize the model to rapidly analyze test results and devise corrective action. It also includes an automated pattern recognition algorithm, allowing for detailed analysis of mask topographies. The equipment also includes an array of wafer inspection accessories, including advanced stage automation, light source and advanced stabilizer systems. These accessories are designed to ensure that inspections are performed with the highest level of accuracy and precision. In addition to its imaging capabilities, ZYGO 6010T also provides a range of mask measurement and comparison features. This includes automated glass thickness measurements, image alignment and defect detection, and the ability to compare data from various layers and surfaces to detect differences. The system is also equipped with comprehensive metrology capabilities, allowing for measurements of various parameters from the inspected wafers. These include profile, area and outline measurements, as well as defect classification and test algorithms. Overall, AV 6010T offers a comprehensive mask and wafer inspection solution, ideal for process control, quality control and final yield-related issues. It is equipped with industry-standard data analysis and image processing tools, advanced inspection accessories and comprehensive metrology capabilities, allowing users to effectively and accurately analyze test results.