Used ZYGO Mark GPI-XPS #293617695 for sale

ZYGO Mark GPI-XPS is a mask and wafer inspection equipment designed to provide fast and accurate defect detection, and to improve lithography yield. The system's advanced imaging capabilities enable it to capture high-quality images in a wide range of wavelengths, and its sophisticated analysis algorithms can detect even the smallest lithographic defects. Mark GPI-XPS features a full-field group optics imaging mode, which allows for extended field-of-view inspection. It also provides multiple bin-defect mapping tools, which enable users to customize their detection criteria. Additionally, the unit features real-time focus adjustment, which enables it to quickly and efficiently capture clear images of various patterns and shapes. ZYGO Mark GPI-XPS includes a dual-station objective lens, allowing for simultaneous imaging of two different wafers. This dual-station imaging makes it easier to detect defects in both regions of the wafer with a single move. The objective lens provides image magnification up to 500X, enabling users to observe defects as small as 1.5nm. The machine also provides a variety of image resolution modes and can capture images in both 2D and 3D. In 3D mode, the tool gathers surface topography information, enabling users to gain insight into the structure and profile of a sample. It also provides a range of image processing and analysis tools, including auto-correction, EDSEM/ZZ-SAF, 3DTEM/FTAT, and other loop inspection tools. Overall, Mark GPI-XPS is an incredibly reliable and robust asset, offering fast and accurate defect detection for the next generation of lithographic processes. It enables users to visually verify wafer and mask patterns quickly and efficiently, helping to improve production yield and throughput.