Used ZYGO Mark II #117240 for sale

ZYGO Mark II is a mask & wafer inspection equipment that can be used to analyze semiconductors of various sizes, shapes and materials. It is recognized by the semiconductor industry as a reliable and accurate tool for evaluating critical features of a component during the production process. Mark II's high-accuracy optical imaging technology is designed for inspecting the surface of masks, wafers and other semi-conductors for imperfections or defects. It has an impressive resolution of 1 micron for all inspection tasks. This allows for a very detailed analysis, ensuring that any adverse features that could affect performance are accurately identified. ZYGO Mark II's software package is designed to help the user quickly identify possible defects. Its onboard defect analyzer is capable of recognizing a variety of patterns for common defects such as delamination, gaps, scratches, pits, pits and dislocations. Additionally, the system's print agreement tool aids in the matched-released feature, helping to ensure that every partially inspected component matches its specification and also matches any other components in the same order. Mark II's user-friendly controls enable the user to select and choose different tools and settings. The options available enable the user to customize the settings in order to capture the desired results. The unit can then produce a detailed report summarizing the scanning results, which can be shared with other members of the production team. The machine is designed for maximum flexibility and reliability, with an adjustable light source, which makes it ideal for a variety of applications. The unit is equipped with two stages, so two processes can occur at the same time; one for mask scanning and one for wafer inspection. Additionally, its rapid scanning microscope makes it possible to inspect large swaths of an area quickly. ZYGO Mark II is an invaluable tool for the semiconductor industry, allowing for detailed and accurate quality control to be performed during production. Its impressive resolution and ability to quickly identify defects makes it an ideal investment for quality assurance.