Used ZYGO Mark IV XPS #9262840 for sale

ZYGO Mark IV XPS is a high-speed, high-resolution optical imaging and inspection equipment, designed to enable semiconductor manufacturers to quickly and accurately evaluate mask and wafer defects, both before and after fabrication. Utilizing its proprietary XDISC inspection technology, this system uses a powerful, variable-field-of-view microscope to provide the user with high magnification capabilities. Additionally, a sophisticated optical image processor is employed, allowing for higher information collection speed and higher accuracy. The main features of the unit include a large-format, large-depth-of-field image analysis camera, capable of acquiring images at up to 24-bit color resolution with a maximum resolution of 4,096 x 4,096 pixels. This allows for superior image quality, while reducing image degradation due to diffraction. Additionally, a specially designed image processing algorithm is employed to further enhance image detail and accuracy when recognizing defection. Mark IV XPS also features a wide range of inspection illumination options, allowing users to quickly and accurately identify particles and other defects in their semiconductor wafers. These include both bright field and dark-field illumination, as well as polarized tip and microscope illuminations. Additionally, a dual imaging mode is also available, allowing for simultaneous imaging of the front and back of the wafer. The machine is further enhanced by a range of ergonomic features, including a motorized 360-degree sample holder and a low-vibration sample stage. This ensures accurate and repeatable results on every inspected wafer. Moreover, ZYGO Mark IV XPS includes a range of automated defect detection and analysis capabilities, allowing users to quickly and easily assess their wafers and determine whether or not any defects are present. Finally, with its easy-to-use interface, Mark IV XPS makes it easy for users to process their images and analyze their results. This tool also includes a range of post-processing functions, allowing users to adjust their settings and further refine their image results. By utilizing these functions, users can quickly and accurately identify particle- or other defects within their semiconductor wafers. Overall, ZYGO Mark IV XPS is a robust and reliable mask and wafer inspection asset, designed to quickly and accurately analyze defects. Its advanced image processing features, ergonomic design, and automated detection capabilities make it an ideal tool for users looking to quickly and accurately inspect their wafers.