Used ZYGO NewView 200 #9351638 for sale

ZYGO NewView 200 is a powerful mask and wafer inspection equipment that is designed to accurately analyze large areas of semiconductor wafers, as well as flat substrates of up to ZYGO 200 mm in diameter. The system offers a wide range of inspection and analysis capabilities in a versatile and compact design. NewView 200 features high-resolution imaging, optimal contrast, and excellent depth of field to accurately inspect large mask or wafer surfaces and features. The unit is equipped with software that can automatically detect and isolate defects, scan large wafer areas without the need for site settings, and achieve high inspection speeds. 200 can also perform precise measurements with minimal noise. The machine features an advanced stage design, which allows it to accurately scan and inspect larger wafer and substrate areas than conventional solutions. The high-quality imaging capabilities enable large feature sizes to be accurately identified and isolated. This makes it possible to support the analysis of multiple layers of fine line patterning, ensuring that the defects that may occur during the manufacturing process can be quickly and accurately located. ZYGO NewView 200 also includes powerful algorithms and defect inspection software. These enable it to detect, classify, and review defect types such as scratches, residues, particles, and voids. The software can also detect foreign material and out-of-spec stains for enhanced resolution. Overall, ZYGO 200 is an excellent choice for efficiently inspecting large mask or wafer surfaces and features. It offers excellent imaging and defect detection capabilities in a versatile and compact design, making it ideal for manufacturing process control applications.