Used ZYGO NewView 5000 5022 #293645351 for sale

ZYGO NewView 5000 is a mask & wafer inspection system designed to offer advanced optical metrology capabilities to businesses seeking precise analysis of masks and wafers. It is built to accommodate samples of any size, with a large stage and multiple field of view options for both wafers and masks. ZYGO 5000 incorporates a versatile motorized XYZ scanning stage for optimal movement of samples within the system, which can be operated in XY, XYZ, 3D, or video scan modes to accurately capture measurements. It includes precision optics to ensure high levels of accuracy and repeatability, with a degree of resolution (depending on the application) up to a few nanometers. NewView 5000 also has a variety of illumination options to match any specialized mask and wafer inspection requirement, such as collimated, ring, and dark field illumination. 5000 is powered by a sophisticated yet easy-to-use software interface, allowing users to quickly and accurately input measurements by creating automated custom user profiles. With its powerful reporting capabilities, ZYGO NewView 5000 can generate detailed graphical summaries of metrology analysis results that can be easily used for data analysis. This makes it easy to spot trends or any inconsistencies that need to be addressed by the user. In terms of hardware features, ZYGO 5000 is built for durability, with a robust aluminum housing enclosed in a temperature-controlled chamber that helps provide protection from dust, heat, and vibration. It also includes a variety of accessories to support different types of mask and wafer inspection, such as a pedestal, extension arm, and reticle pocket. All in all, NewView 5000 is a powerful mask & wafer inspection system that offers business owners the ability to analyze their products with high levels of accuracy and repeatability. Its versatile designs, intuitive software interface, multi-faceted optics, robust hardware, and accessories make it an ideal solution for businesses requiring the highest quality of metrology analysis.