Used ZYGO NewView 5000 #293586679 for sale

ZYGO NewView 5000 is an automated mask and wafer inspection equipment designed to evaluate and inspect photomasks, reticles, and wafers with extreme accuracy and repeatability. This state of the art system is a unique tool that is capable of inspection of large-format designs (up to 8-inch dimensions) with feature sizes as small as 50 nanometers. ZYGO 5000 is a comprehensive wafer inspection unit that incorporates advanced imaging, including scanning electron microscopy for high magnifications, automated defect classification and classification rules inspection, and state-of-the-art computational imaging software to analyze the data. NewView 5000 features industry-leading resolution capabilities and has the ability to detect extremely small defects. It is capable of identifying defects as small as 1 micron and can measure features of arbitrary size from sub-micron to several tens of microns. The machine is equipped with advanced pattern recognition algorithms and provides precise measurements for process control, wafer inspection and yield enhancement. The software used for 5000 is designed for easy user access to all the capabilities and functions of the tool. The Windows operating asset based user interface is intuitive and user-friendly and allows for easy access to all model control parameters including a library of stored operator-defined and pre-set recipes. For quality control, ZYGO NewView 5000 includes tools such as SPC (Statistical Process Control) and 3D review capabilities. The equipment also offers sophisticated reports, such as wafer surface maps, contact hole maps, line defect maps, mathematical analysis, parametric analysis and cross-section images. ZYGO 5000 is a robust, reliable, and versatile system that is compatible with the latest industry standard technologies. The unit is capable of being remotely managed from ZYGO HQ software solution which provides end-to-end defect and process analysis with web-based visuals that can be viewed from any computer. NewView 5000 is an ideal tool for process characterization, optimization and assurance for high performance semiconductor wafer quality control. It provides a comprehensive suite of capabilities for inspecting photomasks and wafer with maximum accuracy and reliability.