Used ZYGO NewView 5032 #9375626 for sale

ZYGO NewView 5032 is a mask and wafer inspection equipment designed to enhance semiconductor process control and yield management. The system is configured with a 5-axis stage and a high-performance optical microscope, offering a range of viewing and imaging capabilities. The unit features a variety of interferometry and microscopic imaging options, enabling users to measure a variety of defects, including mass and profile nonuniformities, surface roughness, and dimensional and optical nonuniformities. It is capable of measuring defects down to a few nanometers in size, giving users a comprehensive view of the sample from multiple angles. The machine also incorporates advanced image processing, mask editing, pattern recognition, and statistical analysis features, giving users a comprehensive set of tools for defect analysis. NewView 5032's sample stage is designed to accept different substrates, including silicon wafers and films, as well as hybrid substrates. The stage is optimized for 1-micron resolution along the sample's X or Y axes, with a maximum scanning speed of 2 nanometers per second. The 5-axis motion control allows for precise positioning of the sample with minimal disturbance, giving users high accuracy and repeatability measurements. The tool's optical microscope is equipped with a variety of imaging and focusing lenses, allowing the operator to capture the finest details of the sample. It offers a wide range of magnifications, from 2x to 50x, along with spectral imaging and contrast enhancement feature. The microscope also boasts optical image stabilization, providing superior image stabilization and minimized shrinkage of the map. ZYGO NewView 5032 integrates with an array of third-party systems for enhanced functionality, giving users a comprehensive suite of options to customize the asset to their specific needs. It can be connected to automated test platforms, such as test and measurement equipment, throughput controllers, and analysis systems for full integration into existing production processes. Additionally, the model can be connected to various computer systems, such as PCs and smartphones, for remote access to the data. Ultimately, NewView 5032 provides a versatile solution for mask and wafer inspection, combining powerful imaging, interferometry, and analysis tools with the accuracy and repeatability of a 5-axis stage design. Its wide range of imaging options, customizable features, and compatibility with multiple third-party systems make it an excellent choice for process control and yield management.