Used ZYGO NewView 6000 #9279845 for sale

ZYGO NewView 6000 is a powerful and versatile mask and wafer inspection equipment that offers high resolution imaging and automated defect detection. It is capable of inspecting samples up to 300 millimeters (mm) in size with sub-micron resolution, making it ideal for inspection applications in the semiconductor industry. The system uses high-resolution stereo optics for imaging, illumination and focus control. It features a proprietary vibrating CCD camera which enables full area scanning and simultaneous operation of two cameras - one for top-down imaging and one for bottom-up imaging. The unit can achieve sub-micron horizontal resolutions of 1.0, 1.2, 1.5, 2.0, 2.5, 3.0 and 6.0 microns, and vertical resolutions of 0.5, 1.0 and 1.5 microns, provide imaging capabilities at the highest resolution that are extremely accurate and reliable. In terms of defect detection, the machine includes a suite of automated tools and advanced algorithms that enable fast and accurate detection of defects. It features photomask and wafer overlay comparison capabilities, broken centering detection, wafer scan imaging for embedded features, and rejects due to contamination, thickness variation and edge defects. The easy-to-use user interface allows for quick set-up and preparation of samples for testing. The tool also comes with a variety of optimization tools and analytical features for data exploration and defect analysis. It can be integrated with a range of external test equipment for more comprehensive asset testing and characterization. Lastly, the model is designed with a modular construction so that different components can be added and swapped out as needed. It is also compatible with a range of software packages for image acquisition and analysis, as well as live monitoring and control. NewView 6000 is a powerful mask and wafer inspection equipment that offers high resolution imaging and automated defect detection, making it an ideal choice for a variety of inspection applications.