Used ZYGO NewView 6300 #9134757 for sale

ZYGO NewView 6300 mask and wafer inspection equipment is a high-precision, automated electronic inspection system that provides reliable and accurate measurements. The unit can be used to inspect semiconductor wafers, flat panels, photomasks, MEMs, and other devices, ensuring that they meet key dimensional and topographical requirements. The machine is equipped with a rear-mounted, high-precision CCD array sensor coupled with advanced image processing algorithms to ensure accurate results. It is designed to measure features such as point-to-point distances, straightness, parallelism, grid dimensions, angles, and circularity. The tool also collects high-quality 2D and 3D image data which can be used for a variety of metrological analysis. ZYGO NEW VIEW 6300 has a fully automated digital processing station which includes a fully programmable generative software module which can be used to automatically detect, position, and optimize the measurement parameters for a wide range of parts. The asset is designed for production line applications and is robust enough for continuous operation. The model is also configurable with a wide range of software options such as inspection, background subtraction, foreign material identification, review and defect detection and mask alignment. The automated focusing options provide sharp images and quick setup for the most complex parts. NewView 6300 also offers a range of features such as automatic sample identification, edge detection, measurement fields, image reversal, and various measurement categories. It can collect multiple image sets from one sample and compare them over time to ensure that the image parameters remain consistent. The equipment is designed with an intuitive user interface and is fully compatible with existing systems. It is perfect for high-volume, repeatable, and accurate inspection in semiconductor or advanced electronics settings. The system is fast, efficient, and reliable; ensuring that high standards of accuracy and precision are maintained.