Used ZYGO NewView 7100 #9059521 for sale
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ID: 9059521
Surface Structure Analysis System
Optical 3D profiler, P/N: NV6K-0110
Sample stage: motorized X-Y axis, 6" x 6" travel, manual tip/tilt, Z-axis control, P/N: NV6K-0232
5x Michelson interferometer, P/N: NV6K-0451
20x AF Mirau interferometer, P/N: NV6K-0512
Manual 4-position turret with encoder, P/N: NV6K-0312
SiC flatness standard, 30mm d, P/N: NV6K-0710
Workstation table: P/N: 6300-3434-01
Vibration isolation table, P/N: 1840-700-105.
ZYGO NewView 7100 provides high resolution, automated interference imaging for mask and wafer inspection. This state-of-the-art inspection equipment utilizes real-time imaging to capture images of masks and wafers with nanometer-level resolutions. NewView 7100 is a compact design offering integrated data acquisition, analysis, reporting, and workflow management, allowing for rapid, accurate inspection. ZYGO NewView 7100 is built with an advanced imaging toolset that includes variable exposure imagery, wide-field imaging, interference imaging, and phase/height images. This system utilizes white light interference that holds the traditional dark field imaging advantages with the added capability of capturing multiple high-resolution images in quick succession. The powerful optics of the unit provide real-time viualization that offers high contrast capability with minimal noise. NewView 7100 is designed for use across a range ofmask and wafer inspection operations. Whether used for wafer defect characterization, overlay, resisted, or non-resist imaging, ZYGO NewView 7100 can provide reliable imaging results. This machine is capable of detecting low reflectivity, dust, particles, and other minute defects. It also offers automated image optimization and a uniform image flat field for superior inspection results. NewView 7100 is designed with an advanced software suite for easy operation and precision control. This tool offers the latest in Intuitive user interface, markup, auto-calibration technology, and calibration override capability. ZYGO NewView 7100 software includes powerful artificial intelligence and image analytics tools, allowing users to manage and analyze data with ease. This asset also includes an integrated defect database for easier storage, retrieval, and archiving of inspection results. NewView 7100 offers automated defect detection, classification, and reporting capabilities. This includes defect classification based on user-defined and pre-defined criteria for specific items and defect classifications. It also includes a triple-phase inspection process, allowing the model to identify and classify defects with consistent and reliable accuracy. Overall, ZYGO NewView 7100 is an ideal solution for mask and wafer inspection applications. With its high-resolution optics, intuitive software, and powerful imaging toolset, this equipment provides rapid and reliable inspection results. It offers reliability and precision, giving users the confidence that their inspections are accurate without sacrificing accuracy or speed.
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