Used ZYGO NewView 7300 #9203848 for sale

ZYGO NewView 7300 mask and wafer inspection equipment provides cost-effective, high-resolution inspection of both reticles (masks) and wafers. The system utilizes state-of-the-art, high-magnfication optics combined with bright, uniform illumination to provide images of exceptional accuracy and ease of use. ZYGO NEW VIEW 7300 employs a dual mode imaging platform. Through the use of an optional wafer platen, the unit is capable of automatically scanning both masks and wafers quickly and accurately. The innovative optical design also supports multiple imaging resolution settings, allowing for optimized image acquisition for differing substrates as well as for reticles and wafers. In addition to the dual mode imaging platform, NewView 7300 is equipped with white light annular illumination and a laser slit pattern projector for high performance imaging. The annular illumination compensates for surface distortions of topographically varying substrates while simultaneously improving image clarity and contrast. The patented laser slit projector utilizes a linear array of pixels to form a line pattern across the field of view. The pattern provides a uniform background reference and helps improve accuracy when inspecting reticles. To ensure data accuracy and consistent results, NEW VIEW 7300 utilizes a modern computing platform with a Windows-based graphical user interface (GUI). Automated functions, such as automatic feature recognition, chip mapping, and defects analysis, are also built in for fast and reliable operation. This feature-rich machine is equipped with standard memory for up to two thousand images and three megabytes of program memory. ZYGO NewView 7300 mask and wafer inspection tool is ideal for inspecting critical components in the production of semiconductors, LCDs, and photomasks. With superior image clarity and automated operational functions, ZYGO NEW VIEW 7300 offers high performance and reliability, resulting in cost savings and enhanced product quality.