Used ZYGO NewView 7300 #9254948 for sale

ZYGO NewView 7300 is an advanced mask and wafer inspection system designed to reduce the time and effort needed for defect evaluation and metrology. It leverages high-resolution telecentric optics to capture multiple images of a patterned wafer and generate real-time feedback, enabling operators to get immediate results. ZYGO NEW VIEW 7300 offers high-accuracy, high-efficiency automated alignment and inspection for precision surface inspection, overlay alignment, and general defect detection. With its Dual Source Technology (DST) feature, it supports both brightfield and darkfield illumination for scanning a wide variety of substrates and inspection geometries. The integration of touchless metrology and high-resolution imaging provides accurate measurements without interfering with the sample surface. Additional features of NewView 7300 include an integrated microscope to acquire images of the sample surface to facilitate defect analysis, online image pre-processing, and post-processing of data for 3D reconstruction and contour mapping. It also has a user-friendly graphical interface that provides operators with real-time feedback and can be tailored to meet specific applications. Feedback collected from NEW VIEW 7300 can be used to facilitate process improvement and identify process-related issues in a timely manner. Its integrated software can be used to manage inspection and quality data, and draw correlations between these parameters and defect type, number, location, and size. With its multiple imaging, interactive, and advanced analysis capabilities, ZYGO NewView 7300 provides a complete solution for defect detection and characterization. ZYGO NEW VIEW 7300 is designed to handle most flat panel display, mask, and wafer inspection tasks efficiently and accurately with minimal operator intervention. Its advanced capabilities make it an ideal choice for quality control laboratories and R&D facilities that need to achieve the highest standards in product inspection and metrology.