Used ZYGO NewView 7300 #9266461 for sale

ZYGO NewView 7300 is an automated mask and wafer inspection equipment. It is designed to provide users with fast, high-resolution imaging and pattern overlay performance for any mask or wafer application. The system offers a range of features including a 7.2 megapixel CMOS imaging sensor, a bright LED backlight, 4:1 zoom optics with 6" to 25" throughput field of view, and advanced algorithm analysis capabilities. ZYGO NEW VIEW 7300's imaging unit delivers detailed images with up to 3.2µm pixel size resolution. The imaging sensor is capable of capturing images up to 1920 x 1080 resolution. The machine also supports multiple imaging modes such as bright field, dark field, and polarizing contrast techniques. The tool's brightness and uniformity illumination asset, is designed to provide high contrast images with minimal color shifts when acuumeriazing backlit images. NewView 7300's advanced optical model also offers a range of features designed to maximize accuracy, sensitivity and analysis. The 4:1 zoom optics allow for a variable field of view range from 6" to 25" and consistent focus throughout the entire field of view. The equipment also includes an automatic focus system that can automatically adjust the lens and image capture to optimize the focus depth. The mask and wafer analysis capabilities of NEW VIEW 7300 are powered by advanced algorithm design. The unit supports a range of analysis techniques to analyze line widths, defects, slopes, edge position, edge sharpness, resonance, and more. Users can easily customize analysis parameters using the machine's intuitive graphical user interface. ZYGO NewView 7300 also offers a range of additional features designed to improve ease-of-use and data security. These features include a touchscreen LCD display, password protection, multiple user accounts, JPEG report printing, and remote access. The tool can also be configured to generate reports based on specific criteria and to integrate with other QA systems. In summary, ZYGO NEW VIEW 7300 is an automated mask and wafer inspection asset that is designed to provide fast and accurate imaging, pattern overlays, and advanced algorithm analysis capabilities. Its 7.2 megapixel imaging sensor and 4:1 optical zoom model allow users to maximize accuracy, sensitivity, and analysis. Additional features such as touchscreen LCD display, remote access, and customizable analysis make this equipment an ideal solution for any mask or wafer application.