Used ZYGO PTI-01 #9238260 for sale

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ZYGO PTI-01
Sold
Manufacturer
ZYGO
Model
PTI-01
ID: 9238260
Vintage: 1986
Interferometer Configuration: Vertical 1986 vintage.
ZYGO PTI-01 is an automated wafer and mask inspection system. This tool is used to compare a wide range of optical images of a mask or wafer against a pre-defined template. The system is designed to detect any irregularities in the images that might cause problems in the production process. It is a highly advanced piece of precision equipment that helps to identify potential defects in masks or wafers at the earliest stage of their production. PTI-01 employs a variety of automated optical and imaging techniques to examine the wafers or masks under consideration. It uses a Diffractive Optical Element (DOE) to capture the information of the mask or wafer image. These images are then stored and analyzed using Computer Aided Imaging (CAI) and Quantitative Image Analysis (QIA). CAI is used to detect any defects or impurities in the mask or wafer by comparing the image to a reference template. This is done by taking measurements such as defect area, apparent size, and defect severity. QIA is used to further classify any irregularities in the image, such as microscopy, color anomalies, and the type of defects. In addition, ZYGO PTI-01 utilizes several advanced optical techniques. These include image sampling, photometry, microlithography, and interferometry. Image sampling is used to generate high resolution images of the mask or wafer in order to ensure accurate image analysis. Photometry allows for the accurate measurement of the light intensity in different areas of the image. Microlithography is employed to detect any distortions in the image due to the production process. Finally, PTI-01 uses interferometry to measure any surface irregularities in the wafer or mask. ZYGO PTI-01 is a powerful tool to inspect masks and wafers efficiently. Its advanced imaging techniques allow for an extremely accurate and comprehensive analysis of the mask or wafer images. The system is able to detect defects such as microscopic misalignments, missing features, and surface anomalies. It is also capable of categorizing these defects based on their degree of severity. This allows manufacturers to identify any potential issues as quickly and efficiently as possible. In this way, PTI-01 is an invaluable tool for quality control in the production of masks and wafers.
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