Used ZYGO ZMI 7702 #9363714 for sale

ZYGO ZMI 7702 is a Mask & Wafer Inspection equipment designed to accurately inspect semiconductor devices for defects. This system is based on an automated analyzer and accompanying microscope to provide superior image quality and inspection capabilities. The unit is designed to achieve excellence in defect management and routing of wafer fabrication processes in semiconductor technologies. ZMI 7702 utilizes a custom automated analyzer to precisely focus and move the microscope stage, ensuring high resolution, repeatable images. The machine is capable of measuring sub-micron features accurately and efficiently, including high-density circuits, memory arrays, and multilayer wiring. It also allows for the measurement of defect sizes, the search of critical DC characteristics, and the detection of transistor defects. The tool is equipped with a Digital Image Analysis Module (DIAM) which leverages the capabilities of image and pattern recognition for advanced defect detection. ZYGO ZMI 7702 uses a state-of-the-art microscope that enables it to generate magnifications from 5X to 2000X. This high-resolution microscope offers both bright field and dark field illumination to allow for better visualization of complex semiconductor patterns, including defects. The microscope utilizes a full CCD color digital camera for high-quality images and video. In addition, ZMI 7702 uses an automated alignment asset with a sample-calibration feature to ensure that the sample is accurately aligned before positioning. This model provides greater accuracy and repeatability in the inspection process. ZYGO ZMI 7702 also provides easy-to-use user interfaces to facilitate efficient and accurate inspections. Its user-friendly nVision software is designed to streamline inspection workflows and provide real-time data. The integrated Search software is also included for quick and easy defect location. In summary, ZMI 7702 is a comprehensive, high-performance Mask & Wafer Inspection equipment, with advanced imaging and defect detection capabilities that can be used in a variety of applications. The automated analyzer, microscope, and Digital Image Analysis Module (DIAM) provide superior image quality and accuracy, while the user friendly interfaces and software optimize the inspection process.