Used BRUKER / VEECO Dimension 3100 #9366126 for sale

ID: 9366126
Atomic Force Microscope (AFM).
BRUKER / VEECO Dimension 3100 is a high-performance atomic force microscope (AFM) that is designed to visualize and manipulate nanometer scale objects. It is capable of providing information about the shape, size, and surface properties of objects at multi-nanometer length scales. VEECO Dimension 3100 utilizes a low-noise, high-accuracy M-DriveTM scanner that allows users to quickly access nanometer-scale images. With it, sample resolutions of 0.12nm can be achieved in a single scan. BRUKER Dimension 3100 is equipped with topographic and imaging modes including our RhythmTM, V-shape CaptureTM, AutoTap, and PrecisePeakTM modes. These modes offer separate resolution and imaging speed optimization capabilities, each optimized for different imaging conditions. In addition to the imaging modes, Dimension 3100 also offers advanced manipulation modes such as Force Curve Imaging, Micromanipulation, and Force Volume Mapping. The imaging capabilities of BRUKER / VEECO Dimension 3100 are optimally supported by advanced instrument accessories and external instruments such as imaging and visualizing nanogaps, nanorobotics, shear force imaging, and 4D (contact, force overlap, and force modulation) imaging. VEECO Dimension 3100 is a complete imaging and manipulation solution. It offers excellent resolution and imaging speed capabilities, advanced imaging and manipulation modes, and comprehensive accessories. As a result, BRUKER Dimension 3100 is tested in a wide variety of scientific and engineering fields ranging from materials science, electronics, and biomedical nanotechnology to surface science, nanobiology, and nanomagnetism.
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