Used BRUKER / VEECO Dimension Edge #293640598 for sale
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BRUKER / VEECO Dimension Edge is an Atomic Force Microscope (AFM) recommended for imaging and analysis of nanostructured surfaces. It combines the power of VEECO high-performance AFM with the versatility of BRUKER Scanning Ion Conductance Microscopy (SICM). VEECO Dimension Edge is ideal for nanoscale imaging and metrological analysis in materials research, semiconductor and biodiagnostics. It has the capability of measuring surfaces at the nanometer scale, providing users with high-resolution images of nanostructures. BRUKER Dimension Edge combines BRUKER / VEECO highest resolution AFM imaging and advanced SICM technology. This combination enables researchers to image and analyze a variety of structures with high accuracy and sensitivity. The SICM provides exceptional imaging of nanosurfaces, such as soft biological samples. The AFM probe is equipped with an ultra-stable cantilever design and an adjustable frequency range. It is equipped with a wide range of metrological and imaging capabilities, with the ability to detect surface features as small as 0.03 nm. The SICM is regularly calibrated to ensure accurate results and comes with a variety of tip styles, from rigid diamond tips to soft gels. The instrument is easy to use and features a 5.7-inch color touchscreen for rapid operation and a user-friendly software interface for data management. The software tools are compatible with Windows and can be used for data processing and image analysis. It also includes advanced modules for 3D imaging and automated imaging for faster analysis. In addition, Dimension Edge includes an integrated air conditioning system, a built-in laser interferometer, environment and vibration monitoring, and an automated electrostatic planarization system. This instrument is designed to yield reliable and accurate results, even in challenging environments. Its advanced features and the easy user interface make BRUKER / VEECO Dimension Edge the perfect choice for imaging and analysis of nanostructured surfaces.
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