Used BRUKER / VEECO Dimension Edge #293640600 for sale
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BRUKER / VEECO Dimension Edge is a scanning probe microscope (SPM) specifically designed for correlative research. It combines unique Beyond Resolution operation with powerful imaging modes, allowing researchers to observe, inspect and analyze nanoscale features on samples ranging from biological specimens, to metal and semiconductor surfaces. VEECO Dimension Edge features a large analytical field-of-view and extended in-plane resolution. It is equipped with high-performance sample scanning capabilities, including both height and lateral scanning, 3D imaging and non-contact topography. Additionally, the option of video-rate scanning enables higher data throughput. For valuable imaging and analysis, BRUKER Dimension Edge has an edge detection feature which is capable of detecting structural features of nanoscale size (i.e. artifacts, interfaces, etc.). Also, due to its sophisticated optical design, the microscope can generate superior quality images of surfaces and defects by means of monochromatic imaging mode. Furthermore, advanced user controllability, particularly in the area of image processing, is featured in Dimension Edge. It comes with an extensive toolbox of image data acquisition, manipulation, analysis and visualization tools. This provides advanced, quantitative data analysis capabilities, such as advanced surface roughness analysis and phase imaging. BRUKER / VEECO Dimension Edge has innovative auto probe and analysis functions which permit automatic operation and maintenance. Its durable, vibration-reduced design ensures stability and accuracy. Furthermore, VEECO Dimension Edge is designed with an intuitive graphical user interface (GUI) for easy operation and data visualization. BRUKER Dimension Edge offers reliable, quantitative measurements in a variety of fields including biology, semiconductor lithography, electronics, mechanics, chemistry, and polymer science research. It is a versatile, versatile, and comprehensive imaging and analysis tool, allowing researchers to visualize and analyze samples with unprecedented precision and speed.
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