Used BRUKER / VEECO Dimension Edge #293640601 for sale

BRUKER / VEECO Dimension Edge is a state-of-the-art scanning probe microscope that combines the best elements of scanning electron microscopy (SEM) and atomic force microscopy (AFM). VEECO Dimension Edge utilizes a design that allows for a range of techniques to be performed with the same instrument without the need for multiple machines. It is suited for both research and industrial applications, such as imaging polymers, metals, and molecular assemblies. The instrument is composed of three main parts: a scanning chamber, an imaging source and scanning probes. The scanning chamber is a vacuum chamber, which eliminates contamination and features a computer-controlled environmental-column which allows adjustment of pressure and humidity. The imaging source is VEECO state-of-the-art Electron Optics Technology (EOT), which includes a BPM-801 Photonics Source and a field-emission gun. This source is capable of high resolution images, such as nanoscale imaging, with fast scanning speed and high lateral and vertical resolution. The scanning probes are variable and can be used in cantilever mode, tapping mode, and contact mode for greater flexibility. BRUKER Dimension Edge also offers a wide range of options for customizing the instrument for specific applications. The main user interface consists of a large, high-resolution Vacuum Console LCD display with an active-matrix touchscreen. This touchscreen is used to access control functions, parameter selection, and data acquisition. Among the many settings available are motor settings for high speed, low noise scanning and image capture settings for enhanced resolution and contrast. Dimension Edge also has a built-in statistical analysis mode for assessing sample size, reducing particle bombardment during imaging and evaluating grain boundaries. The microscope also has the ability to perform extended Fourier Transform Infrared Spectroscopy (FTIR) and X-ray Photoelectron Spectroscopy (XPS). In short, BRUKER / VEECO Dimension Edge is a versatile and powerful scanning probe microscope, capable of performing high quality imaging, analysis, and characterization at nanoscale. Its combination of advanced imaging source, optimized environmental column, and readily adjustable scanning probes make it an ideal choice for a wide range of applications.