Used BRUKER / VEECO Dimension Icon #293664080 for sale

BRUKER / VEECO Dimension Icon
ID: 293664080
Atomic Force Microscope (AFM).
BRUKER / VEECO Dimension Icon is a versatile and highly advanced scanning probe microscope (SPM) used for topographic imaging in a variety of research and industrial applications. The equipment features an innovative design that provides users with precision measurements, fast scanning, and higher resolution imaging. VEECO Dimension Icon features a 3-axis mechanical design that utilizes a hybrid stage for performing XYZ manipulations, allowing it to reach higher positions and greater accuracy without risk of damage. The system also comes with an 8-channel probe selection unit, which enables users to select the probes based on their requirements for surface topography. BRUKER Dimension Icon is capable of measuring not only surface topography but also other features such as ridge width, step heights, grain size, and morphology. Additionally, this machine also includes a nano-stylus cantilever tip that provides users with an even greater surface topography measurement resolution. The tool is also equipped with a multi-fix immersion optics asset, a scanning tunneling microscope (STM), and a high-temperature oxidation mode, all of which provide the user with higher resolution scanning results. Moreover, Dimension Icon has a powerful and intuitive software interface that gives users complete control over the scanning parameters. It features a powerful statistical analysis tool for both imaging and spectrum data processing, data manipulation, and data presentation. The software also provides users with the ability to perceive and analyze the data in real time. Finally, this model is robustly designed and highly professional. Its durable construction ensures good performance even under extreme conditions. Additionally, the equipment is highly compatible and can be used in combination with other SPM systems and systems from different vendors. Overall, BRUKER / VEECO Dimension Icon is an advanced scanning probe microscope with a versatile design. Its innovative features, such as multi-fix immersion optics, scanning tunneling microscope, and high-temperature oxidation mode, provide users with the most accurate surface topography measurements possible. Additionally, its intuitive software interface and robust design make it suitable for a wide variety of research and industrial applications.
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