Used BRUKER / VEECO Dimension Icon #293768905 for sale

BRUKER / VEECO Dimension Icon is an atomic force microscope (AFM) designed for nanoscale imaging, profiling, and metrology. It is capable of high-resolution topography and imaging of samples with atomic-scale resolution. VEECO Dimension Icon employs leading-edge, low-noise, closed-loop sensors for height control. This allows for higher throughput and greater reproducibility for imaging and profiling of samples. An advanced scanning controller is designed to maintain precise positioning of the scan area while ensuring smooth operation of the AFM. BRUKER Dimension Icon includes several innovative features such as live cantilever bending detection, dynamic force trimming, and an optional electrostatic force corrective option for use in the presence of electric fields or electric charges. The AFM is also designed for compatibility with industry standard software and accessories, including the NanoWizard® Software Suite interface. This user-friendly software enables real-time imaging, profiling, and other high-resolution metrology. The AFM is also compatible with several other data acquisition systems. Dimension Icon is available with a variety of system configurations, including combined SEM/AFM modules, white light and laser confocal imaging, and external scanning electronics with inverted, heated sample stages. The AFM features a wide range of sample preparation and imaging accessories, including automated scanning tips for high-resolution imaging. In addition, the AFM has an optional optical system for visible and infrared spectroscopy, allowing user to analyze their samples at the nanoscale level. BRUKER / VEECO Dimension Icon is engineered to handle high-performance imaging applications in a variety of environments, including high vacuum, air, and below subzero temperatures. This allows researchers to image a variety of materials with greater ease. In conclusion, VEECO Dimension Icon is a powerful atomic force microscope that is designed for advanced nanoscale imaging and profiling. This instrument is capable of atomic-scale resolution and incorporates innovative features such as live cantilever bending detection and dynamic force trimming. It is also compatible with a wide range of user-friendly software and accessories. The AFM is engineered for use in a variety of environments, including high vacuum, air, and sub-zero temperatures, and is ideally suited for high-performance imaging applications.