Used BRUKER / VEECO Dimension Icon #293827010 for sale

BRUKER / VEECO Dimension Icon is a state-of-the-art atomic force microscope (AFM) that offers unprecedented access to nanoscale science. This sophisticated imaging instrument is designed to provide researchers with the highest possible resolution of surface structures and properties by enabling nanoscale imaging and characterization of biological and inorganic samples. It features a versatile scanning head with flexible scanning modes, a unique sample approach equipment, and a powerful control system. VEECO Dimension Icon has a large working distance of 300mm for ease of sample changing and offers an objective lens design with an aperture down to 5µm. This allows for imaging of small features with sharp imaging performance and minimal thermal drift. The dynamic range of the instrument is up to 15N with a noise level better than 0.5 nanoamp, while the resolution is 100 picometers. The instrument's advanced scanning head is capable of topographic imaging as well as tapping mode, lateral force microscopy (LFM) and Z-piezo modulation scanning. The head also contains nine piezo scanners with up to 6µmscanning area, enabling it to take high resolution images with fast scanning speeds. BRUKER Dimension Icon uses a unique sample approach unit that is integrated into the microscope optics. This machine offers precise vertical positioning of the sample with a resolution of 10 nanometers. It also allows for direct surface contact measurements without the need for a cantilever and greatly reduces the complexity of studies. Dimension Icon is controlled by a high-performance computer with a user-friendly interface. This tool is used to set the scanning parameters and data acquisition, as well as analyze and store image data. It also enables easy integration with other instruments such as optical microscopes. Overall, BRUKER / VEECO Dimension Icon is a powerful imaging instrument that offers unparalleled performance for nanoscale research. With its flexible scanning modes, unique sample approach asset and intuitive control model, researchers can explore the properties of surface structures with an unprecedented level of detail.