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ID: 9037640
Atomic force microscopes
X-Y scan range: 90µm x 90µm typical, 85µm minimum
Z range: 10µm typical in imaging and force curve modes, 9.5µm minimum
Vertical noise floor: <30pm RMS in appropriate environment typical imaging bandwidth (up to 625Hz)
X-Y position noise (closed-loop): ≤0.15nm RMS typical imaging bandwidth (up to 625Hz)
X-Y position noise (open-loop): ≤0.10nm RMS typical imaging bandwidth (up to 625Hz)
Z sensor noise level (closed-loop): 35pm RMS typical imaging bandwidth (up to 625Hz);
50pm RMS, force curve bandwidth (0.1Hz to 5kHz)
Integral nonlinearity (X-Y-Z): <0.5% typical
Sample size/holder: 210mm vacuum chuck for samples, ≤210mm diameter, ≤15mm thick
Motorized position stage:
(X-Y axis) 180mm × 150mm inspectable area;
2µm repeatability, unidirectional;
3µm repeatability, bidirectional
Microscope optics:
5-megapixel digital camera;
180µm to 1465µm viewing area;
Digital zoom and motorized focus
Controller: NanoScope V
Workstation: Integrates all controllers and provides ergonomic design with immediate physical and visual access
Vibration isolation: Integrated, pneumatic
Acoustic isolation: Operational in environments with up to 85dBC continuous acoustic noise
AFM modes:
Standard: ScanAsyst, TappingMode (air), Contact Mode, Lateral Force Microscopy, PhaseImaging, Lift Mode, MFM, Force Spectroscopy, PeakForce Tuna, Force Volume, EFM, Surface Potential, Piezoresponse Microscopy, Force Spectroscopy
Optional: PeakForce QNM, HarmoniX, Nanoindentation, Nanomanipulation, Nanolithograpy, Force Modulation (air/fluid), TappingMode (fluid), Torsional Resonance Mode, Dark Lift, STM, SCM, C-AFM, SSRM, TUNA, TR-TUNA, VITA.
BRUKER / VEECO Dimension Icon is a state-of-the-art atomic force microscope (AFM) that offers unprecedented access to nanoscale science. This sophisticated imaging instrument is designed to provide researchers with the highest possible resolution of surface structures and properties by enabling nanoscale imaging and characterization of biological and inorganic samples. It features a versatile scanning head with flexible scanning modes, a unique sample approach equipment, and a powerful control system. VEECO Dimension Icon has a large working distance of 300mm for ease of sample changing and offers an objective lens design with an aperture down to 5µm. This allows for imaging of small features with sharp imaging performance and minimal thermal drift. The dynamic range of the instrument is up to 15N with a noise level better than 0.5 nanoamp, while the resolution is 100 picometers. The instrument's advanced scanning head is capable of topographic imaging as well as tapping mode, lateral force microscopy (LFM) and Z-piezo modulation scanning. The head also contains nine piezo scanners with up to 6µmscanning area, enabling it to take high resolution images with fast scanning speeds. BRUKER Dimension Icon uses a unique sample approach unit that is integrated into the microscope optics. This machine offers precise vertical positioning of the sample with a resolution of 10 nanometers. It also allows for direct surface contact measurements without the need for a cantilever and greatly reduces the complexity of studies. Dimension Icon is controlled by a high-performance computer with a user-friendly interface. This tool is used to set the scanning parameters and data acquisition, as well as analyze and store image data. It also enables easy integration with other instruments such as optical microscopes. Overall, BRUKER / VEECO Dimension Icon is a powerful imaging instrument that offers unparalleled performance for nanoscale research. With its flexible scanning modes, unique sample approach asset and intuitive control model, researchers can explore the properties of surface structures with an unprecedented level of detail.
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