Used BRUKER / VEECO Dimension Icon #9312250 for sale

ID: 9312250
Atomic Force Microscope (AFM).
BRUKER / VEECO Dimension Icon is a scanning probe microscope that offers unparalleled capabilities for investigation and measurement of surface features. It combines several instruments in one, including scanning tunneling microscopy (STM), atomic force microscopy (AFM), contact mode AFM, and in-situ electrical/optical/mechanical characterization. It also features simultaneous imaging of multiple modes at a single location, low noise operation, dynamic cantilever detection, and easy integration of accessories. VEECO Dimension Icon utilizes the latest in nanotechnology, enabling researchers to study a wide variety of materials from any scale, from the nanoscale to bulk materials. The equipment includes a unique modular design that makes it easy to adapt to any user's needs. It employs three precision motors for amplitude control and acts as an advanced scanning system, making it capable of high-resolution imaging. It also includes several imaging modes that allow for a variety of applications such as chemical imaging, topography, and piezoresponse. The instrument also has an integrated temperature control unit. This ensures accurate measurements and temperature stability throughout the measurement range. It also features phototech stability, in which the microscope keeps the focus and alignment at a constant level when the sample position is changed due to the vibration-resistant optical machine. Furthermore, BRUKER Dimension Icon combines a large sample area with high resolution detailed images, so it is ideal for use in advanced materials analysis and nanotechnology. The tool also features an intuitive easy-to-use graphical user interface. It provides a visual representation of the material and its properties, along with precise x/y/z coordinates and scans, making it easier to analyze the data. Finally, the asset provides an array of software tools that allow for detailed data analysis and integration with other systems. Overall, Dimension Icon scanning probe microscope is a powerful and versatile model for the study of surface features from any scale. It offers high resolution imaging and multiple imaging modes, phototech stability, integrated temperature control, and intuitive GUI, as well as various software tools for integration and data analysis.
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