Used BRUKER / VEECO Dimension VX 305 #293665809 for sale

ID: 293665809
Vintage: 2006
Atomic Force Microscope (AFM) 2006 vintage.
BRUKER / VEECO Dimension VX 305 is an advanced scanning probe microscope that allows for highly precise measurements to be made on microscopic scale surfaces. This microscope combines a variety of measurement techniques such as atomic force microscopy (AFM), scanning tunneling microscopy (STM), and scanning capacitance microscopy (SCM). VEECO Dimension VX 305 incorporates a two axis scanner, allowing for precise positioning of the sample and control of the scan field. The scanner offers a broad range of scan raster sizes from 10 nanometers up to 30 millimeters. The microscope includes an integrated scan frame, with closed loop servo control for improved positioning accuracy. This also aids in measurement quality by enabling constant, repeatable scanning motion and movement. BRUKER Dimension VX 305 is controlled by a powerful PC based controller, which connects to the instrument via a secure Ethernet interface. This controller ensures a high degree of automation and accuracy in operation of the microscope, including measurement quality feedback and control. The measurement capabilities of Dimension VX 305 are further augmented by its various imaging modes. The microscope provides capabilities such as contact, tapping, and dynamic force microscopy (DFM). Multiple imaging modes such as frequency modulation, phase imaging, and lateral force microscopy allow for outstanding results in a wide range of applications. BRUKER / VEECO Dimension VX 305 is versatile in its operational environment. The microscope is equipped with a number of environmental control features, such as temperature control, gas supply control, and humidity monitoring. This allows the microscope to be used in demanding environmental conditions and a wide range of analytical and metrology applications. The microscope is also capable of viewing samples below and above the surface of the sample. VEECO Dimension VX 305 is truly a unique and versatile scanning probe microscope that can be used to make highly precise and detailed measurements of microscopic scale surfaces. With its combination of capacitance, tunneling, and other imaging modes, BRUKER Dimension VX 305 is an ideal choice for a wide range of industries and applications.
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