Used BRUKER / VEECO Dimension X3D #9150545 for sale

ID: 9150545
Wafer Size: 12"
Vintage: 2006
Atomic Force Microscope (AFM), 12" UI Rack Main body Device monitor 2006 vintage.
BRUKER / VEECO Dimension X3D is a high-performance analytical scanning probe microscope (SPM) designed to enable non-contact surface characterization for a variety of applications. It utilizes advanced technology, including a range of high resolution scanning modes to provide an unparalleled level of spatial resolution. VEECO Dimension X3D is the top-of-the-line model in the Dimension SPM family. It is capable of analyzing materials with a resolution down to 0.1nm in a controlled environment, enabling dynamic imaging of nanosized features and structures. It also enables large-area measurements with exceptional lateral resolution, allowing users to collect complex three-dimensional data quickly and easily. BRUKER Dimension X3D is equipped with a variety of thermal and optical feedback mechanisms as well as a wide range of scan modes that enable users to perform a variety of operations without impacting the sample. It is also equipped with a large-size sample stage that allows for rapid data collection over a large area with a minimum of motion and thermal drift. The device's flexibility and high-resolution capabilities enable users to acquire data ranging from nanoscale (e.g. contamination and chemistry analysis) to various imaging applications, including topography, ultra-high-resolution imaging, and parameter maps. Additionally, Dimension X3D is capable of scanning in both air and liquid environments and characterizing a wide variety of materials, including organic and inorganic materials, metals, and semiconductors. BRUKER / VEECO Dimension X3D also includes a high-level of software integration, streamlining data analysis and enabling automated functions to facilitate user-friendly operation. Its user-friendly SPM enables users to perform a wide range of experiments with a minimum of training. VEECO Dimension X3D is a high-performance scanning probe microscope that is engineered for easy user operation and reliable, high-resolution imaging. It enables the accurate characterization of surfaces down to the nanoscale and includes a wide range of integrated software tools that facilitate automated and easy operation. With its range of varied capabilities, it is an ideal tool for researchers studying nanomaterials, materials science, and more.
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