Used BRUKER / VEECO Icon 3 #9257586 for sale

BRUKER / VEECO Icon 3 is a scanning probe microscope (SPM) used to analyze sample surfaces at the nanoscale level. It can be used for a variety of research applications such as biological and materials science, semiconductor physics, or microelectronics. VEECO Icon 3 uses a scanning tunneling microscope (STM) and an atomic force microscope (AFM). BRUKER Icon 3 has a wide range of features for sample analysis. It has a high-sensitivity digital imaging equipment with a camera that allows for easy analysis of a wide variety of nanostructures. It also has a high-resolution stage movement system that allows sample manipulation with great accuracy. Icon 3 is capable of imaging samples at an atomic-level resolution, and can measure in environments down to temperatures of 4K. Scanning tunneling microscopy (STM) is a non-invasive imaging technique using an ultra-sharp conductive probe, which is used to measure the surface topography of a sample. The sample is mounted onto a special plate, and the probe is then scanned across its surface while the sample is kept in a vacuum. As the probe scans the sample, it senses the quantum force, which is generated between the probe and the sample surface. The resulting data is collected and used to build an image of the sample at the nano-scale level. This methodology allows the researcher to gain detailed information about the sample's features, such as atomic-level resolution images or their chemical composition. Atomic force microscopy (AFM) is a technique in which a very fine tip is scanned across the sample surface in order to measure the forces at various points on the sample. This technique allows for the visualization of features on a sample's surface with an out-of-plane resolution of about 0.01 nanometers. BRUKER / VEECO Icon 3 is also capable of tracking multiple sample points at once to obtain a 3D image of the surface. VEECO Icon 3 includes a variety of tools and software for sample analysis, such as general-purpose software that allows the researcher to perform basic measurements of samples, as well as more specific software packages. These software packages can provide deeper analysis of samples, allowing the researcher to investigate properties such as the electrical and thermal properties of the sample. In summary, BRUKER Icon 3 is a high-resolution scanning probe microscope with a wide range of capabilities. Its high-resolution imaging unit and stage movement machine allow scientists to study samples with great accuracy, down to an atomic level resolution. Icon 3 also has a variety of software packages for sample analysis, making it an indispensable tool for researching at the nanoscale level.