Used BRUKER / VEECO MultiMode 8 #293602191 for sale
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ID: 293602191
Atomic Force Microscope (AFM)
Nanoscope V Controller
Electro chemistry module
Monitor
PC
Tip holders:
Standard AFM Holder
HR AFM Holder
STM Holder
Scanners:
Picoforce 1B440-PF:
Module
Range:
X / Y: 46.5 microns
Z: 20 microns
EV Liquid resist scanner:
Range:
X / Y: 17.6 microns
Z: 3.81 microns
6595A Scanner:
Range:
X / Y: 1.24 microns
Z: 0.66 microns.
BRUKER / VEECO MultiMode 8 is a scanning probe microscope designed to provide a range of advanced visualizations and analysis capabilities for material science research. It offers a suite of analytical techniques, including atomic force microscopy (AFM) and/or scanning tunneling microscopy (STM), combined in a modular platform. The microscope is equipped with a wide range of analysis features that allow the user to capture topographical, electrical and mechanical data of samples in ultra-high resolution. The AFM and STM modes are used to measure the mechanical and electrical properties of surfaces, as well as to view images of various materials down to nanometer resolution. This allows researchers to get valuable insight into the structure, composition, and other physical characteristics of the sample. VEECO MultiMode 8 can be used for low-temperature sample analysis, providing information about the composition, structure and defect densities of mechanically weak samples. The equipment is equipped with both ambient and liquid environments for conducting in situ sample measurement. The liquid environment can be used for measuring the dynamic behavior of samples in complex liquids or gaseous environments. The microscopy system works with a wide range of materials from both inorganic and organic sources. BRUKER MultiMode 8's intellectual property architecture supports the development of custom measurement strategies, which are fully integrated into the unit. This allows researchers to acquire data quickly and accurately, with minimal user interaction. It also helps to reduce the analysis time with automatic analysis features. MultiMode 8 also offers a variety of visualization tools for quickly analyzing and interpreting the data for efficient analysis. It includes both 2D and 3D imaging modes and is equipped with advanced signal processing algorithms for extracting the desired data from the image results. Additionally, the machine can be used in combination with a wide range of other laboratory equipment, such as SEMs, TEMs, and transmission electron microscopes to produce further insight into the nature and behavior of materials. In conclusion, BRUKER / VEECO MultiMode 8 is an advanced scanning probe microscope designed to provide high-resolution imaging and analysis of a variety of materials with a wide range of capabilities. The tool is equipped with features that allow for faster and more accurate sample analysis. It is suitable for both inorganic and organic sample characterization and is highly customizable, enabling custom data processing strategies. Its powerful visualization and signal processing tools allow for rapid analysis and summarization of data, providing the researcher with a comprehensive view of the material's behavior.
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