Used BRUKER / VEECO Ultra Scan Control C #9098198 for sale

BRUKER / VEECO Ultra Scan Control C is a scanning electron microscope (SEM) designed to deliver cutting edge performance in imaging, spectroscopy, and lithography applications. Using a combination of high-resolution ion detectors and powerful software, VEECO Ultra Scan Control C provides detailed analysis of a range of materials, including metals, polymers, and carbon-based materials. BRUKER Ultra Scan Control C offers excellent image resolution, due to its low aberration column and low background noise. The X-Y scan range of the instrument is up to 8mm, and a wide range of detectors provide spectroscopic information, such as X-ray emission, Auger electron energy spectra, and SEM elemental images, each of which can be taken at a range of magnifications from 0.5nm to 10µm. Ultra Scan Control C features a high-precision autofocus system that ensures image quality by providing corrective feedback, even for small changes in sample height. The system also allows for dynamic adjustments to the depth of field and magnification, as well as movement along the z-axis. Furthermore, a wide range of sample holders can be used, allowing for specimens of differing geometries to be studied. BRUKER / VEECO Ultra Scan Control C is capable of carrying out repeat scanning of the same sample to allow for statistical analysis. An image alignment (ILA) feature enables ultra-high-speed imaging of variable specimen samples, with incredibly small dwell times. The automated ILA also ensures accurate imaging of multiple samples without the need for re-alignment. In addition, the advanced signal collection system allows researchers to modify parameters for storing and analyzing data. Software features, such as peak and valley detection, allow for quick measurement of pore and grain size, as well as surface roughness measurement. VEECO Ultra Scan Control C also features an array of powerful analysis and evaluation tools, including a histogram display, labeling features, and two-dimensional contour maps. Overall, BRUKER Ultra Scan Control C is an advanced SEM device that offers a wide range of features for imaging, spectroscopy, and lithography applications, and is capable of delivering detailed analysis of a range of materials. With its combination of high-resolution ion detectors and powerful software capabilities, it is an ideal instrument for researchers in a variety of disciplines.