Used BRUKER / VEECO X-D3 AFM #9281333 for sale

BRUKER / VEECO X-D3 AFM is a type of atomic force microscope (AFM) used for nanoscale imaging and surface analysis. It has a very high resolution of 1.5 nm in the x, y, and z dimensions for submicron analysis of magnetic, electrical, and mechanical properties of various surfaces. The X-D3 is known for its ease of use, accuracy, and reliability, making it an ideal choice for both professional and amateur researchers alike. The AFM works by scanning nanometre-scale sample surfaces with a tip that is attached to a cantilever. The movement of the cantilever is measured by a laser and an optical detector. The cantilever is offset at an angle and produces a small amount of force throughout the scanning procedure. VEECO X-D3 AFM is integrated with multi-mode capabilities, including contact (which measures changes in contact force between the cantilever and sample surface) and non-contact (in which the cantilever operates in an unloaded condition). With the contact mode, the X-D3 is capable of accurately imaging and measuring various types of surface topography, such as topographic height variations, bumps, and cavities. The non-contact mode is ideal for studying local mechanical properties, such as friction and elastic modulus. The X-D3 is also equipped with a new high-resolution DataCube imaging system, which incorporates digital micromirror device (DMD) technology for advanced 3D imaging. This system provides a highly detailed image with greater accuracy than traditional 2D imaging methods. The power of the DataCube is further enhanced by superresolution imaging, which surpasses the resolution of conventional imaging by effectively using a motion blur to combine multiple images. The X-D3 is also optimised for measuring current-voltage (I-V) characterization with a built-in electrometer, which allows users to quickly and accurately measure transitions in electrical resistance or capacitance. Further, the AFM comes with an integrated PicoScan IV controller, which provides real-time feedback during experiments, enabling users to better measure nanoscale properties such as hysteresis curves and magnetic domains. The flexibility of this AFM makes it the perfect choice for industries such as microelectronics, biotechnology, semiconductor, and data storage research.